Yta Microchip 2 Bit, SOIC, Operationsförstärkare, 10 MHz 6 V, 8 Ben

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RS-artikelnummer:
598-092
Tillv. art.nr:
MCP6L92T-E/SN
Tillverkare / varumärke:
Microchip
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Varumärke

Microchip

Produkttyp

Operationsförstärkare

Typ av fäste

Yta

Kapseltyp

SOIC

Antal kanaler

2

Antal ben

8

GBP – produkt för förstärkt bandbredd

10MHz

Maximal matningsspänning

6V

Minsta matningsspänning

2.4V

Slew-rate

7V/μs

Minsta arbetsstemperatur

-40°C

Ingångs-bias-ström

1 pA

Vos – offsetspänning för ingång

4 mV

Maximal arbetstemperatur

125°C

Höjd

1.45mm

Standarder/godkännanden

RoHS Certificate of Compliance

Serie

MCP6L92

Fordonsstandard

Nej

Utström

30mA

Ingångsoffsetström

±1 pA

COO (ursprungsland):
TH
The Microchip Precision Operational Amplifier is designed for high-performance applications. The device integrates unique features that enhance its utility across a wide range of uses including sensor signal conditioning and audio applications. With its low offset voltage and high gain, this operational amplifier delivers outstanding accuracy and stability, ensuring your designs perform reliably under various conditions. It operates within a wide supply voltage range, making it versatile enough to accommodate different operating environments. Whether you’re working on consumer electronics, industrial applications, or automotive systems, this op-amp offers the reliability and functionality to meet diverse engineering demands. Its compact package design simplifies PCB layout, allowing for efficient use of space in your designs.

Offers low offset voltage for increased precision in signal processing

Ideal for audio applications due to its excellent linearity

Features a wide supply voltage range for flexible integration

Designed with low distortion to enhance audio clarity

Temperature compensated to maintain performance across varying conditions

Compact package facilitates efficient PCB layout and design

Offers robust performance in both consumer and industrial applications

Integrated ESD protection to ensure device longevity in harsh environments

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