Keysight Technologies Digital Bench Power Supply, 0 → ±25V, 0 → 1A, 3-Output, 30W - UKAS Calibrated

Keysight E3631A, E3632A, E3633A & E3634A basic programmable DC power supplies give users the performance of system power supplies at a very attractive price. All models provide clean power, excellent regulation and a fast transient response with built-in GPIB and RS-232 interfaces. While affordability is a key attribute, these power supplies have the quality and reliability to meet the most demanding applications - for example in R&D design verifications, production testing and QA verifications.

• E3631A The triple output, 80 W, GPIB, E3631A provides small, compact size for bench use; low output ripple and noise; built-in measurements and basic programmable features with GPIB and RS232 interface. This reliable supply is designed for general purpose applications and combines convenient bench top capabilities with flexible system features in a compact, multi-output package.
• E3632A The single output, 120-200 W, GPIB, E3632A-E3634A provide dual range outputs; small, compact size for bench use; low output ripple and noise; as well as built-in measurements and basic programmable features with GPIB and RS232 interface. The Agilent 120W, GPIB, single output E3632A is a high performance supply optimized for manual and basic automated testing; and, with a combination of bench top capabilities and system features, it is designed to help improve measurement quality and reduce test time.
• E3632A-E3634A Keysight basic DC power supplies offer essential features for a tight budget. The single output, 120-200 W, GPIB, E3632A-E3634A provide dual range outputs; small, compact size for bench use; low output ripple and noise; as well as built-in measurements and basic programmable features with GPIB and RS232 interface. The Keysight 200W, GPIB, single output E3633A is a high performance supply optimized for manual and basic automated testing; with a combination of bench top capabilities and system features, it is designed to improve measurement quality and reduce test time.